3D Si-based nanochannel platform for robust cell electroporation

P. Bertani, L. Q. Chang, D. Gallego-Perez, V. Malkoc, L. J. Lee, W. Lu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Electroporation is a cellular delivery method making use of a voltage pulse to propel exogenous material through the cell membrane and into the cell allowing the modification of a given cell or cell population. An ideal electroporation system would possess four characteristics encompassing the benefits of all these systems: (1) high throughput, (2) high cell viability, (3) excellent deliver efficiency, and (4) controlled dosage. Many advances1-2 in cell electroporation allow for high throughput, high cell viability, or excellent dosage control, yet no platform is available for the combination of all three. In this work, we show a "3D nanochannel electroporation (NEP) system" (Fig. 1a) on a silicon-chip platform designed to meet these three criteria. This "NEP chip" is patterned on one side using a ∼500 nm circle array and the other using a 50 μm array. Each pattern is then etched through until connection is established as shown in Fig. 1b. The etching of the 3D NEP chip is done using the Bosch process, a combination of SF6 and C4F8 plasma chemistries giving a highly directional etch for creation of high aspect ratio features. The result is a 3D nanochannel array consisting of nanopores that are ∼500 nm in diameter and 20-25 μm deep. The backside microchannel array consists of wells that are 50 μm in diameter and ∼225-230 μm deep.

Original languageEnglish
Title of host publication73rd Annual Device Research Conference, DRC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages83-84
Number of pages2
ISBN (Electronic)9781467381345
DOIs
StatePublished - Aug 3 2015
Event73rd Annual Device Research Conference, DRC 2015 - Columbus, United States
Duration: Jun 21 2015Jun 24 2015

Publication series

NameDevice Research Conference - Conference Digest, DRC
Volume2015-August
ISSN (Print)1548-3770

Other

Other73rd Annual Device Research Conference, DRC 2015
Country/TerritoryUnited States
CityColumbus
Period06/21/1506/24/15

Keywords

  • Propulsion
  • Reliability
  • Three-dimensional displays

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