Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films

Julia Deitz; Santino Carnevale; Marc De Graef; Yoosuf N. Picard; Stephen A. Ringel; Tyler Grassman; David W. McComb

doi:10.1017/S1431927614004486

Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films

Julia Deitz
, Santino Carnevale
, Marc De Graef
, Yoosuf N. Picard
, Stephen A. Ringel
, Tyler Grassman
, David W. McComb

Comprehensive Cancer Center

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	552-553
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614004486
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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10.1017/S1431927614004486

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title = "Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films",

author = "Julia Deitz and Santino Carnevale and \{De Graef\}, Marc and Picard, \{Yoosuf N.\} and Ringel, \{Stephen A.\} and Tyler Grassman and McComb, \{David W.\}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614004486",

language = "English",

volume = "20",

pages = "552--553",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films

AU - Deitz, Julia

AU - Carnevale, Santino

AU - De Graef, Marc

AU - Picard, Yoosuf N.

AU - Ringel, Stephen A.

AU - Grassman, Tyler

AU - McComb, David W.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927924688

U2 - 10.1017/S1431927614004486

DO - 10.1017/S1431927614004486

M3 - Conference article

AN - SCOPUS:84927924688

SN - 1431-9276

VL - 20

SP - 552

EP - 553

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films

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